| 1 | | Reliability and Electromigration Degradation of GaAs Microwave Monolithic Integrated Circuits by Aris Christou | | 1 |
| 2 | | Simulation and Computer Models for Electromigration by Pin Fang Tang | | 27 |
| 3 | | Temperature Dependencies on Electromigration by Michael Pecht and Pradeep Lall | | 79 |
| 4 | | Electromigration and Related Failure Mechanisms in VLSI Metallizations by Aris Christou and M. C. Peckerar | | 105 |
| 5 | | Metallic Electromigration Phenomena by Simeon J. Krumbein | | 139 |
| 6 | | Theoretical and Experimental Study of Electromigration by Jian Hui Zhao | | 167 |
| 7 | | GaAs on Silicon Performance and Reliability by P. Panayotatos and A. Georgakilas and N. Kornilios | | 235 |
| 8 | | Electromigration and Stability of Multilayer Metal-Semiconductor Systems on GaAs by Aris Christou | | 263 |
| 9 | | Electrothermomigration Theory and Experiments in Aluminum Thin Film Metallizations by Aris Christou | | 291 |
| 10 | | Reliable Metallization for VLSI by M. C. Peckerar | | 317 |
| | | Index | | 339 |