Surface Analysis Methods in Materials Science (Springer Series in Surface Sciences)

Surface Analysis Methods in Materials Science (Springer Series in Surface Sciences)

Yazar : John O Connor Brett Sexton Roger S.C. Smart
Yayınevi : Springer
ISBN : 9783540413301
Baskı yılı : 2003
Sayfa sayısı : 616
Ağırlık : 0.98 kg
Stok durumu : Tükendi   
This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references. It outlines the application of surface analysis techniques to a broad range of studies in materials science and engineering. The book consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 19 techniques and a section on applications. This book is aimed at industrial scientists and engineers in research and development. The level and content of this book make it ideal as a course text for senior undergraduate and postgraduate students in materials science, materials engineering, physics, chemistry and metallurgy.
1 Solid Surfaces, Their Structure and Composition by C. Klauber and R. St. C. Smart 3
2 UHV Basics by C. Klauber 71
3 Electron Microscope Techniques for Surface Characterization by P. S. Turner and C. E. Nockolds and S. Bulcock 85
4 Sputter Depth Profiling by B. V. King 107
5 SIMS - Secondary Ion Mass Spectrometry by R. J. MacDonald and B. V. King 127
6 Auger Electron Spectroscopy and Microscopy - Techniques and Applications by P. C. Dastoor 155
7 X-Ray Photoelectron Spectroscopy by M. H. Kibel 175
8 Vibrational Spectroscopy of Surfaces by R. L. Frost and N. K. Roberts 203
9 Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis by S. H. Sie 229
10 Materials Characterization by Scanned Probe Analysis by S. Myhra 247
11 Low Energy Ion Scattering by D. J. OConnor 287
12 Reflection High Energy Electron Diffraction by G. L. Price 307
13 Low Energy Electron Diffraction by P. J. Jennings and C. Q. Sun 319
14 Ultraviolet Photoelectron Spectroscopy of Solids by R. Leckey 337
15 EXAFS by R. F. Garrett and G. J. Foran 347
16 Minerals, Ceramics and Glasses by R. St. C. Smart 377
17 Characterization of Catalysts by Surface Analysis by N. K. Singh and B. G. Baker 405
18 Application to Semiconductor Devices by P. W. Leech and P. Ressel 435
19 Characterisation of Oxidised Surfaces by J. L. Cocking and G. R. Johnston 455
20 Coated Steel by R. Payling 473
21 Thin Film Analysis by G. C. Morris 489
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